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Abstract

It is demonstrated that confocal epi-illumination/collection optics can be effectively used to generate surface-enhanced Raman scattering at the near-field region of a gold-coated tip for an atomic force microscope operated in semi-contact tapping mode. When the tip, with a 50-nm apex radius, was illuminated by a highly focused laser beam at 532 nm and approached the isolated diamond particle, with a size of ∼1 μm, the Raman signal was enhanced by ∼10³. This result is in good agreement with numerical simulations performed by the finite difference time-domain method. Since our apertureless microscope is based on readily available conventional components, there is wide room for improvements and modifications by common users in various applications of micro-Raman analysis.

Keywords

Tip-enhanced Raman spectroscopy Scanning near-field Raman spectroscopy Surface-enhanced Raman scattering Finite difference time-domain method

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Apertureless Tip-Enhanced Raman Microscopy with Confocal Epi-Illumination/Collection Optics

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