Infrared spectra of synthetic, semicrystalline aluminosilicates in the region 500–1200 cm−1 show a dominant band due to Si–O stretching at 980–1030 cm−1 and two combined bands due to Si–O–Al bending at 600–700 cm−1. These bands can be used to determine quantitatively the Si/Al ratio of the aluminosilicates. A calibration curve has been obtained by integrating the intensities of the bands and relating them to Si/Al ratios of 10 aluminosilicate samples as measured with inductively coupled plasma (ICP) with Si/Al ratios ranging from 0.19 to 1.46.
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