Abstract
We have made a study of the total ionization cross-sections of a silane (SiH4) molecule caused by electron impact for a single ionization. Electron-impact ionization cross-sections (EIICS) have been calculated from threshold ionization energy to 1400 eV. The theoretical model, developed by Jain and Khare, has been used to calculate the EIICS for silane. We observed the following product ions: SiH3+, SiH2+, SiH+, Si+, H2+ and H+. The predicted EIICS of silane for all six fragment ions are compared with other theoretical and experimental data. The present model shows a good agreement with the previously reported data.
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