The model is concerned with the problem of calculating the expected number of failures from a population in which items as they fail are replaced by new ones.
Analytical methods are available for the failure of the first generation of items and also for the steady state, but many real problems require a solution for the transient state. This model calculates the expected number of failures for the transient state from failure data for the first generation, that failure data being in terms of one or more Weibull distributions. A feature of the model is its ability to handle early life, random and wear-out failures simultaneously. A computer programme for the model is given.
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