A method of strain measurement in small specimens is described which involves measurement of strain in terms of the net displacement of reference points within the specimen ends rather than on the gauge length. The reference points are the bottoms of axial holes drilled into the specimen heads. The method has been developed for high-frequency dynamic-strain measurement using a novel electro-optical displacement transducer and for low-frequency creep-fatigue work using conventional displacement transducers.
Get full access to this article
View all access options for this article.
References
1.
WallmarkJ. T.NewG.‘Semiconductor photo-cell using the lateral photoeffect’, Proc. Inst. Radio Engrs195745, 474–55.
2.
WilliamsT. L.‘Development and application of SIRA position-sensitive photo-cells’, SIRA Rev.19656 (2).
