Abstract
Shot peening has long been recognized as a method for treating metal surfaces in order to improve their resistance to crack initiation and propagation. In view of shot-peening control, it would be useful if methods for direct measurement or estimation of residual stresses and depths of deformed layers were available. The focus of the present paper is on the presentation of high-energy synchrotron X-ray diffraction that allows better understanding of shot-peening residual strain profiles. Furthermore, it attempts to show that considerable elucidation of shot-peening effects can be attained if
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