Abstract
X-rays have obvious attractions for microscopical investigation and the idea of so using them is as old as their discovery by Rontgen in 1895. His conclusion that lenses for X-rays could not be madel carried such authority that it is only in the past ten years or so that various other possibilities have been explored. Whilst a refractive system is now understood to be impractical, rather than impossible, the X-ray reflection microscope has been developed to give a resolving power almost equal to that of the best optical microscope. Quite different methods, involving geometrical projection, photographic enlargement, or the flying-spot technique, have been carried even farther and are becoming routine research tools, particularly in metallurgy and mineralogy. The principles, applications, and limitations of these techniques will be described below, but first we discuss the ways in which they supplement the information derived from established optical and electron-optical methods.
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