Abstract
An ARL 72000 X-ray spectrometer, aided by a PDP-11/05 computer, has been used for rapid laboratory measurement of the tin coating weight and the chromium content of passivation films on tinplate. The FeKα intensity, inversely related to tin coating thickness, was measured and calibrated against destructive methods of thickness measurement.
The relation of observed CrKα line intensity to weight of chromium in the surface layer wasfound to be affected by tin coating thickness. A mathematical relationship for the effect was worked out and this has to be applied by computer.
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References
1.
Beeghly
H. F.
, J. electrochem. Soc. , 1959 , 97 , 152
2.
Pellisier
G. E.
, &
Wicker
E. W.
Electl Mfg , 1952 , 49 , 124
3.
Price
J. W.
, Tech. Publ. Tin Res. Inst. , 1955 , 2 , 239
4.
McGonnage
W. J.
, Non-Destructive Testing ’, 1961 (New York : McGraw-Hill Book Co. Inc .)
5.Norelco Reporter , 1956 , 3, 58
6.Norelco Coating Weight Gauges, Phillips Electrical Instr., Circ., RC 389 3 MF , 762
7.
Gerald
F.
, Z. angew. Phys. , 1952 , 4 (No. 12 )
8.
Keinath
G.
, Natn. Bur. Stand. Circ. , 1958 , 53 , 585
9.
Liebhavsky
H. A.
,
Pfeiffer
H. G.
,
Winslow
E. H.
, &
Zemany
P. D.
X-Rays, Electrons and Analytical Chemistry’ , 1972 , p. 283 (New York : Wiley-Interscience )
10.
Feret
F.
, Chemia Analityczna , 1979 , 24 , 787
11.
Sparks
J.
, &
Britton
S. C.
Sheet Metal Inds , 1964 , 41 , 477
12.
Britton
S. C.
, Br. Corros. J. , 1975 , 10 , 85
13.
Coad
J. P.
,
Mott
B. W.
,
Harden
G. D.
, &
Walpole
J. F.
ibid. , 1976 , 11 , 219
14.
Rauch
S. E.
, &
Steinbicker
R. N.
J. electrochem. Soc. , 1973 , 120 , 735
15.
Rauch
S. E.
, &
Steinbicker
R. N.
Plating , 1975 , p. 246
16.
Albu-Yaron
A.
, &
Smith
D. A.
Br. Corros. J. , 1979 , 14, 133
17.
Servais
J. P.
;
Lempereur
J.
,
Renard
L.
, &
Leroy
V.
ibid. , 1979 , 14, 126