Abstract
This paper provides an outline for the use of secondary ion mass spectrometry (SIMS) in the determination of diffusion data in metal oxides. The focus is on the determination of Nb bulk and grain boundary diffusion coefficients in TiO2 and zirconia. Specifically, the diffusion of Nb in TiO2 and yttria doped (10 mol.-%) ZrO2 (10YSZ) has been assessed. The following bulk diffusion coefficients D93Nb were obtained
D93Nb =(1·03±0·051) × 10−18 m2 s−1 10YSZ(1273K)
D93Nb =(1·91±0·096) × 10−16 m2 s−1 TiO2(1273K)
The grain boundary diffusion parameter for Nb grain boundary diffusion in 10YSZ was also determined
D93Nbδα =(7·48 ± 0·37) × 10−25 m2 s−1 10YSZ(1273K)
The Nb grain boundary diffusion coefficient D′93Nb was determined to be
D′93Nb =(3·99 ± 0·20) × 10−16 m2 s−1 10YSZ(1273K)
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