Reaction kinetics of PLZT formation and its effect on structural and dielectric properties

Abstract

The solid state reaction of PbTiO₃, PbZrO₃ and La₂O₃ to form Pb_0·92La_0·08(Zr_0·65Ti_0·35)O₃ (PLZT) at different temperatures and heating rates was investigated. A non-isothermal kinetic empirical model was used to evaluate the activation energy. The activation energy evaluated for PLZT formation was found to be 320 kJ mol⁻¹. The rhombohedral unit cell parameter ‘a‘ was found to increase with heating temperature, however the crystallite size and approximate grain size were found to decrease with increasing heating temperature. Energy dispersive X-ray spectroscopy analysis suggests that faster heating rate and high temperature inhibits PLZT formation due to the slow diffusion of La³⁺ ion in the lattice. Also the slow heating rate leads to excess evaporation of lead oxide. Best dielectric behaviour and ferroelectric polarisation (P_r) were found for sample heated at 1100°C. High dielectric loss and low grain boundary resistance were observed for the samples treated with fast heating rate and high temperature.

Keywords

PZT QUANTITATIVE XRD ACTIVATION ENERGY DIELECTRIC CONSTANT REMNANT POLARISATION IMPEDANCE ANALYSIS

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