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Abstract

Time of flight secondary ion mass spectrometry (ToF-SIMS) has the unique ability to simultaneously obtain chemical information (elemental and molecular) with its spatial distribution on a subcellular scale. Recent progress in instrumentation, in particular the developments of cluster ion beam sources, has resulted in a growing interest in applying ToF-SIMS to a range of biological samples. In this review, the instrumental and methodological approaches responsible for this interest are presented along with some examples where the technique has been successfully applied.

Keywords

ToF-SIMS Mass spectrometry imaging Cluster ion beams Biological imaging Molecular depth profiling Reviews

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Characterisation of biological material with ToF-SIMS: A review

Abstract

Keywords

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