Interface microstructure analysis of SiO 2 glass ceramic and Ti–6Al–4V alloy joint brazed with Ti–Zr–Ni–Cu alloy

Abstract

In the present paper, SiO₂ glass ceramic was joined to Ti–6Al–4V alloy with 35Ti–35Zr–10Ni–15Cu (wt-%) filler foil. The whole brazing process was performed under vacuum circumstances at different temperatures (850–1000°C) for several holding times (1–30 min). According to results of scanning electron microscopy, energy dispersive spectrometry, electron probe X-ray microanalysis and X-ray diffraction analysis, the reaction products of the interface are Ti₂O, Zr₃Si₂, Ti₅Si₃, Ti based solid solution and Ti₂(Cu,Ni). There is residual TiZrNiCu braze alloy on the SiO₂ glass ceramic/Ti–6Al–4V alloy interface after brazing. Besides, the interface evolution model of the joint was described by four stages: diffusion and solution among atoms, formation of reaction products, precipitation and growth of reaction layers respectively.