Microstructural path model and strain dependence of recrystallisation in commercial aluminium

Abstract

The isothermal recrystallisation of commercial purity aluminium alloy AA1200 cold deformed to either a true strain of 2 (86·5% reduction in thickness) or 4 (98·2% reduction in thickness) was studied phenomenologically in each material by means of quantitative microscopy. The microstructural path descriptors, V_V, the volume fraction recrystallised, and S_V, the interfacial area density separating recrystallised grains from deformed grains were measured stereologically by electron backscatter diffraction and microstructural path model parameters were deduced for each strain. The effects of strain were delineated and compared with the results of recrystallisation in a slightly different commercial aluminium alloy AA1050 deformed to a true strain of 2·3.