Abstract
An advanced image analysis algorithm is presented for extracting growth curves for individual embedded subgrains during static recovery of deformed metals. The data are obtained by three dimensional X-ray diffraction microscopy. Based on a 5D multicomponent labelling scheme embedded in the full five dimensional experimental space, the algorithm is much faster and less biased than one previously used for the same purpose. The use of the methodology is demonstrated on a study of static recovery in an AA1200 specimen cold rolled to a true strain of 2.
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