Powder metallurgy alloys are typically inhomogeneous with a significant amount of porosity. This complicates conventional transmission electron microscopy sample preparation. However, the use of focused ion beam milling allows site specific transmission electron microscopy samples to be prepared in a short amount of time. This paper presents a method that can be used to produce transmission electron microscopy samples from an Al-Cu-Mg PM alloy.
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References
1.
WilliamsD. B. and CARTERC. B.: ‘Transmission electron microscopy: basics’, Vol. 1, 11; 1996, New York, NY, Plenum Press.
2.
MccaffreyJ. P., PHANEUFM. W. and MADSENL. D.: Ultramicroscopy, 2001, 87, 97–104.
3.
SchraubD. B. and RAIR. S.: Prog. Crystal Growth Charact., 1998, 36, 99–122.
