Truncated repetitive acceptance sampling plans (TRASPs) are introduced in reliability testing to design optimal time-censored inspection schemes with controlled producer’s and consumer’s risks. The device lifetime follows the type I half-logistic Nadarajah-Haghighi (TIHLNH) distribution. In terms of average sample number (ASN), optimal TRASPs outperform both standard repetitive and single sampling plans. Integer nonlinear programming problems are solved to find ASN-optimal and minimax-ASN reliability test plans. Two practical applications are included for illustrative purposes. The results derived for TIHLNH distributions are also valid for any other lifetime model.
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