Reliability of one-shot device with generalized gamma lifetime under cyclic accelerated life-test

Abstract

One-shot devices are products or equipments that can be used only once. A nature characteristic of one-shot devices is that they get destroyed immediately after their use, and therefore their actual lifetimes are never observable. The only information observed is the condition whether they worked or not at the time they are used. These days the quality of products are significantly improved, so that the information obtained under a normal test during a short time is quite limited. A typical test to induce more failures is the accelerated life-test, which is developed by increasing the stress levels under test. In this paper, we will investigate the reliability of one-shot devices with generalized gamma fatigue life under accelerated life-tests with various cyclic temperature fluctuations by assuming a Norris-Landzberg model. Generalized gamma involves many common lifetime distributions, such as gamma, Weibull, lognormal, and positive stable distributions, as special cases. Norris-Landzberg model takes not only temperature change, highest testing temperature, but also the cycling frequency into account when modeling the number of cycles-to-failure, resulting a generalized model with the well-known Coffin-Manson model and Coffin-Manson-Arrhenius model as special cases. Associated inferences are developed. The performance of the proposed model and inferential methods will be evaluated with simulation study and model discrimination. Finally, the chip-scale package solder joints data is analyzed to illustrate the considered model and inferential methods developed in this paper.

Keywords

Accelerated life-test generalized gamma distribution Norris-Landzberg model EM-algorithm one-shot device testing

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