The intermittent fault of an electrical connector is a latent threat to the reliability of an electromechanical system. For electrical connector intermittent fault diagnosis, an intermittent fault must be reproduced. Reproducing an intermittent fault by a traditional test has a low efficiency and adds some damage to the product, which is not conducive to intermittent fault diagnosis. To further improve the reproduction efficiency of an intermittent fault and reduce the damage, optimal design of a step-stress-accelerated intermittent fault reproduction test is carried out. First, the number of intermittent faults and the degree of damage in the reproduction test are estimated, and reproduction and damage models of an intermittent fault during the step-stress reproduction test are constructed. Then, based on the intermittent fault and damage models, an optimized method based on a genetic algorithm is established. Finally, the validity and applicability of the theoretical model and the optimized method of the step-stress-accelerated test based on a genetic algorithm are verified by comparing data from a contrast test.
SorensenBAKellyGSajeckiA, et al. An analyzer for detecting intermittent faults in electronic devices. In: Proceedings of AUTOTESTCON‘94, Anaheim, CA, 20–22 September 1994, pp.417–421. New York: IEEE.
2.
SteadmanBSievertSSorensenB, et al. Attacking ‘bad actor’ and ‘no fault found’ electronic boxes. In: AUTOTESTCON 2005, Orlando, FL, 26–29 September 2005, pp.821–824. New York: IEEE.
3.
SteadmanBBerghoutFOlsenN.Intermittent fault detection and isolation system. In: AUTOTESTCON 2008, Salt Lake City, UT, 8–11 September 2008, pp.37–40. New York: IEEE.
4.
LiangG.Study on space environment reliability test and evaluation of aerospace electrical connector. Hangzhou, China: Zhejiang University, 2012.
5.
AhmadWSPerinpanayagamSJennionsI, et al. Study on intermittent faults and electrical continuity. New York: Elsevier, 2014, pp.71–75.
6.
LinHNHuangYCLinMS, et al. Measurement analysis and improvement technique of signal integrity for high-speed connectors. In: 2012 Asia-Pacific symposium on electromagnetic compatibility, Singapore, 21–24 May 2012, pp.609–612. New York: IEEE.
7.
SavirJ.Testing for single intermittent faults in combinational circuits by maximizing the probability of fault detection. IEEE T Comput2006; 29(5): 410–416.
8.
PanSHuYLiX. IVF: characterizing the vulnerability of microprocessor structures to intermittent faults. In: Design, Automation & Test in Europe conference & exhibition (DATE), Dresden, 8–12 March 2010, pp.238–243. New York: IEEE.
9.
BlomMLippoltB.Diagnosing intermittent faults in telecommunication networks. In: Global telecommunications conference (GLOBECOM’92, Communication for global users), Orlando, FL, 6–9 December 1992, pp.544–548. New York: IEEE.
10.
CorrecherAGarciaEMorantF, et al. Diagnosis of intermittent fault dynamics. In: IEEE international conference on emerging technologies and factory automation, Hamburg, 15–18 September 2008, pp.559–566. New York: IEEE.
11.
GraciaJSaizLJBarazaJC, et al. Analysis of the influence of intermittent faults in a microcontroller. In: 11th IEEE workshop on design and diagnostics of electronic circuits and systems (DDECS), Bratislava, 16–18 April 2008, pp.1–6. New York: IEEE.
12.
NelsonW.Accelerated testing: statistical models, test plans, and data analysis. Hoboken, NJ: John Wiley & Sons, 2008.
NelsonW.Accelerated life testing – step-stress models and data analyses. IEEE T Reliab2009; 29(2) 103–108.
15.
YangNGZaghatiZ.Accelerated life tests at higher usage rates: a case study. IEEE T Reliab2005; 54(1) 53–57.
16.
TsengSTWenZC.Step-stress accelerated degradation analysis for highly reliable products. J Qual Technol2000; 32(3): 209–216.
17.
Wanti SrivastavaPManisha. A zero-failure accelerated degradation test under ramp–soak–stress loading. Proc IMechE, Part O: J Risk and Reliability2017; 232(3): 262–273.
18.
LiQLyuKQiuJ, et al. Research on intermittent failure re-presentation of electrical connector based on accelerated test. Proc IMechE, Part O: J Risk and Reliability2019; 233(3): 317–327. DOI: 10.1177/1748006X18773009.
19.
GuanjunLHuiZJingQ, et al. Mechanism of intermittent failures in extreme vibration environment and online diagnosis technology. Proc IMechE, Part G: J Aerospace Engineering2015; 229(13): 2469–2480.
20.
FuRChoeS Y BJacksonR L, et al. Vibration-induced changes in the contact resistance of high power electrical connectors for hybrid vehicles. IEEE Trans Components Packaging Manufact Tech2012; 2(2): 185–193.
21.
FlowersGTFeiXBozakM, et al. Vibration thresholds for fretting corrosion in electrical connectors. In: Proceedings of the forty-eighth IEEE Holm conference on electrical contacts, Orlando, FL, 22–23 October 2002, pp.133–139. New York: IEEE.
22.
NelsonW.Accelerated life testing – step-stress models and data analyses. IEEE Trans Reliabil1980; 29(2): 103–108.
23.
FardNLiC.Optimal simple step stress accelerated life test design for reliability prediction. J Statist Plan Inference2009; 139(5): 1799–1808.
24.
GeZZLiXYZhangJR, et al. Planning of step-stress accelerated degradation test with stress optimization. Adv Mater Res2010; 118–120: 404–408.
25.
HongSZhouZZioE, et al. An adaptive method for health trend prediction of rotating bearings. Digital Signal Process2014; 35: 117–123.
26.
HongKHongSZhouZ, et al. Condition assessment for the performance degradation of bearing based on a combinatorial feature extraction method. Digital Signal Process2014; 27: 159–166.
27.
ShengHWangBLiG, et al. Performance degradation assessment for bearing based on ensemble empirical mode decomposition and Gaussian mixture model. J Vibrat Acoust2014; 136(6): 61006.
28.
ChenWLiuJGaoL, et al. Accelerated degradation reliability modeling and test data statistical analysis of aerospace electrical connector. Chin J Mech Eng2011; 24(6): 957–962.
29.
GaoLChenWLiuJ, et al. Design criteria for planning multiple stresses accelerated life test. In: Proceedings of 2011 9th international conference on reliability, maintainability and safety, Guiyang, China, 12–15 June 2011. New York: IEEE.
30.
ChenWLiHLianW, et al. Accelerated life test and statistical analysis of aerospace electrical connectors under multiple environmental stresses. J Zhejiang Univ2006; 40(2): 348–351.
31.
EvansMGPolanyiM.Some applications of the transition state method to the calculation of reaction velocities, especially in solution. Trans Faraday Society1935; 31: 875.
32.
EblinLP.Modern chemical kinetics (Eyring, Henry; Eyring, Edward M.). J Chem Educ1963; 40(9): 498.
33.
YangGZaghatiZ. Accelerated life tests at higher usage rates: a case study. In: RAMS‘06 reliability & maintainability symposium, Newport Beach, CA, 23–26 January 2006. New York: IEEE.
34.
JunP.Model and estimate of electrical connectors under vibration stress. Master Thesis, Zhejiang University, Hangzhou, China, 2002.
35.
ShurongWFanyuJ.Environmental test technology. Beijing, China: Electronic Industry Press; 2016, pp.344–345.
36.
MinerMA.Cumulative damage in fatigue. J Appl Mech1945; 12(3): A159–A164.
37.
HauptRL.An introduction to genetic algorithms for Electro magnetics. IEEE Antenna Propagat Mag1995; 37(2): 7–15.
