Abstract
Fit testing is needed during the development process to reduce cost and optimize the performance quality. This paper describes methods for fit testing, as part of the helmet development process, which utilize new surface scanning and innovative fit assessment technologies. Results from some recent fit tests which employed these methods will be presented. While the methods described will be those applicable to helmets, many aspects will be appropriate to other equipment and clothing items as well. The payoff for using such methods are more capable and less bulky items, a better fit for a wider range of personnel with fewer sizes, and reduced development and logistics costs.
Get full access to this article
View all access options for this article.
