Numerical Analysis of the Process for Dielectric Breakdown by Fractal Aspect

Abstract

In the analysis of the dielectric breakdown by numerical methods, the patterns of damage structures mainly depend on the method used to determine the growth probabilities. In this paper, we introduce a new breakdown field parameter in addition to the conventional two parameters in order to consider the very high local field region. The effects of these three parameters on the damage structures are investigated. As a result, the patterns of trees are not only mainly determined by the critical field but also by the breakdown field, and the trees stop growing to make a stable pre-breakdown structure above a certain value of the internal field. By using this method, the relationship between damage structures and physically measurable parameters can be estimated.