A unified in-time correction-based testability growth model and its application on test planning

Abstract

Test management is a critical problem for in-time correction-based testability growth test. For the existing testability growth model, they are either too complex to be implemented in practice, or do not have the ability to draw a smooth test planning/projecting curve. This paper proposes a unified model for in-time correction-based testability growth test and presents its application on the test planning. Firstly, a simple model with only three parameters is developed, and its compatibility with the original Markov model is proved. The revised model only has three parameters, which can reduce the complexity of parameters estimation and increase the certainty of the test planning. Secondly, the paper incorporates the simplified transition probability model with the test cost model and studies the optimal test planning method with the minimum test cost criterion. To illustrate the efficacy of the proposed model, an application of the model to an attitude control system of a helicopter available in the open literature is given. The simulation demonstrates that the model and the method proposed in this paper are reasonable, and they are useful for effectively managing the testability growth test planning problem during system maturation.