Research on the method for measuring the focal spot size of micro-focus X-ray sources using the JIMA resolution test card

Abstract

Background

Measuring an X-ray source's focal spot size is vital for Micro-CT resolution. Standard methods are often too complex or inaccurate. The popular JIMA resolution test card is simple to use but lacks a clear, quantitative formula to determine the actual focal spot size.

Objective

This study aims to create a reliable quantitative link between JIMA resolution and focal spot size using simulations and experiments.

Methods

We used Monte Carlo simulations and practical experiments to establish the relationship between JIMA resolution and focal spot size.

Results

We found that the focal spot size is twice the line pair width on the JIMA card when the image contrast (MTF) is at 10%. This method is highly accurate, with a maximum measurement error of less than 8.7% compared to a high-precision technique.

Conclusions

Our findings provide a simple, fast, and validated method for measuring focal spot size using the JIMA test card. This makes it a practical and reliable alternative to more complex procedures.