Effects of processing conditions o n platinum resistance temperature detectors

Abstract

Routine control of platinum resistance temperature detector manufacture includes (among many other factors) surveillance of resistance values, typically at 0° C (R₀) and 100° C (R₁₀₀), on the finished product, In addition to the use of such measurements in applying acceptance and selection criteria, careful inspection of these data can also provide some insight into the nature of certain systematic changes in R₀ and R₁₀₀ produced by manufacturing procedures or by other, subsequently imposed, processing conditions. There exists, therefore, the possibility of monitoring systematic effects as a means of assessing improvements in product consistency brought about by process developments or as a diagnostic technique for incidental fault conditions that may have arisen. This paper presents analyses of various sets of production-related and experimental data to illustrate the extent to which systematic changes in R₀ and R₁₀₀ can occur under various circumstances. Exploitation of this type of information is not discussed in detail because of its dependence upon various interacting conditions and material properties that are specific to each case.