Abstract
Backscattered electron imaging (BEI) and x-ray analysis have been beneficial in studying the distribution patterns of pesticides on various fabrics. In order to analyze the samples, pesticides were labeled with osmium tetroxide solution, but there was a possibility of inaccurate results because the pesticide on the surface of the fabric could be dislocated in the aqueous medium. A new technique has been developed for labeling the pesticide on the textile material with osmium tetroxide in vapor form, which could produce more accurate results. The overall objective of the study was to compare BEI and x-ray microanalysis results using the earlier and the new methods. Fifteen samples with different fabric, yarn, and fiber characteristics were used for the study. One half of the samples were labeled and prepared using the earlier method and the other half with the new one. The samples were analyzed using BEI and x-ray microanalysis and the results of the two methods compared for similarities and differences.
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