This study examines whether sliver irregularity can be evaluated by using a higher order spectrum, that is, a bispectrum. The thickness variations of slivers drafted with a drawing frame were measured with an evenness tester, and the bispectra of the slivers were calculated. The bispectrum of a mathematically idealized sliver was obtained, and bispectra of a random sliver and two pseudo-random slivers generated by a com puter simulation were calculated.
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