Abstract
Unevenness (the variation in mass per-unit-length) of a sliver (textile strand) is considered a very important parameter for the quality control of textiles. A single index of unevenness, usually in the form of the statistical parameter CV (coefficient of variation), is hardly adequate for current quality-control requirements. A need exists, therefore, for an instrument capable of producing more detailed information quickly.
The instrument described in this paper will print-out accurate data for variance- length curve-one of the important methods of unevenness analysis. A prototype model of the instrument has been built using a unit for converting the linear density into an electrical signal, a 990 prototyping system (TMS 9900 microprocessor), and an A/D converter module as the interface. The performance of the prototype instrument has been tested and the results are reported.
Get full access to this article
View all access options for this article.