In a study of the mechanics of surface attrition of fiber assemblies, a device has been designed and fabricated to be used in conjunction with the scanning electron microscope (SEM). It allows the in situ observation of the deformation of the yam and fabric structures in attrition processes, such as the snagging of a knit fabric by a sharp needle point (or a hook) or the abrasion of a fabric by single or multiple macro-asperities. Some preliminary observations obtained with this device are discussed.
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