Analog Computer Techniques for the Prediction of Transient Nuclear Radiation Effects On Transistor Circuits

Abstract

Analog-computer representation of transistor circuits was developed for predicting transient responses of these circuits during nuclear radiation bursts. Tran sistors were simulated from the measured or man ufacturer-specified characteristic curves. Radiation effects in the transistors were added in the form of transient increase in emitter-to-base potential, and by the reduction of current gain (beta) of the tran sistor with a radiation-controlled negative feedback.* Linear networks between transistors were simulated from the transfer functions of these networks. A com parison is made between the responses of real and simulated single stage common emitter amplifiers and the real and simulated radiation bursts, respec tively.