F concentrations in the outermost layers of human tooth enamel were studied with the aid of a secondary ion microanalyzer. Concentration profiles were recorded in continuous sputtering analysis from the surface down to a depth of about 0.3 micrometer. Samples previously subjected to topical fluoride treatment were compared with reference specimens. In some samples, the results were compared with those obtained at greater depths by macrascopic etching analysis.
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