Abstract
The Mori–Tanaka average stress and the Eshelby tensor for ellipsoids are used within the framework of localized homogenization to estimate the elastic constitutive properties of chiral sculptured thin films (STFs) from their micro-structural details. The devised model contains five arbitrary parameters, whose values can be decided upon by suitable experimentation. Composite compliances governing the elastostatic and the elastodynamic responses of chiral STFs to axial excitation are derived and their dependences on certain microstructural features are examined. The characteristics of the polarization-discriminatory Bragg phenomenon are also delineated.
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