Automating the diagnosis of analogue circuits–a tutorial
A tutorial study of automatic analogue fault diagnosis is presented. Major issues, namely observability, controllability and deduction are explained but then issues of tolerance and fault models peculiar to diagnosis of faults in analogue systems are discussed. A taxonomy of methods is followed by examples and 25 references.
Get full access to this article
View all access options for this article.
References
1.
WilkinsB. R., Testing Digital Circuits — An Introduction, Van Nostrand Rheinhold (1986)
2.
GregoryB. A., Electrical and Electronic Measurements — Encyclopedia of Physical Science and Technology, Vol 5, Academic Press (1992)
3.
RothJ. P., ‘Diagnosis of automata failures: A calculus and a method’, IBM Journal, pp. 278–291 (July1966)
4.
Rogel-FavilaB., WakelingA. J. and CheungP. Y. K., ‘On the acceleration of digital circuit fault diagnosis’, TEST 90 Conference Proceedings, pp. 15–27 (April1990)
5.
ProsserD., ‘The IEE working party on guide-lines for the design and achievement of testability: A summary of current status and progress’, IEE colloquium ‘Design for Testability — What should be taught and why?', Digest No. 1986/98 (9th October1986)
6.
RaultJ. C., ‘A bibliography on fault detection and location in digital systems’, pp. 176–238 of Rational Fault Analysis, edited by SaeksR. and LibertyS. R., Marcel Dekker Inc.
7.
DevesP., MarxJ. P., DagueP. and RaimanO., ‘DEDALE: An expert system for troubleshooting analogue circuits.’ Proc. of the IEEE International Test Conference 1987, Sept. 1st Washington DC, pp. 586-594 (1987)
8.
FreemanS., ‘Optimum fault isolation by statistical inference.’ IEEE Trans. on Circuits and Systems, CAS-26, No. 7, pp. 505–512 (July1979)
9.
HuancaJ. and SpenceR., ‘New statistical algorithm for fault location in toleranced analogue circuits.’ IEE Proc. 130, Part G, No. 6, pp. 243–251 (December1983)
10.
BandlerJ. W. and SalamaA. E., ‘Fault-diagnosis of analog circuits’, Proc. IEEE, 73, No. 8 (1985)
11.
FairhurstM. C., Computer Vision for Robotic Systems, Prentice-Hall (1988)
12.
GonzalezR. C. and WoodsR. E., Digital Image Processing, Addison Wesley (1992)
13.
HochwaldW. and BastianJ. D., ‘A DC approach for analog fault dictionary determination’, IEEE Trans. on Circuits and Systems, CAS-26, No. 7, pp. 523–529 (July1979)
14.
BerkowitzR. S., ‘Conditions for network-element-value-solvability’, IRE Trans on Circuit Theory, CT-9, pp. 24–29 (1962)
15.
RapisardaL. and DeCarloR. A., ‘Analog multifrequency diagnosis’, IEEE Trans. on Circuits and Systems, CAS-30, No. 4, pp. 223–233 (April1983)
16.
DuhamelP. and RaultJ.-C., ‘Automatic test generation techniques for analog circuits and systems: A review’, IEEE Trans. on Circuits and Systems, CAS-26, No. 7, pp. 411–440 (July1979)
17.
McKeonA., The Detection and Location of Faults in Analogue Circuits, Ph.D. Thesis, Dept. of Elec. Eng., Imperial College, London (Jan.1991)
18.
WuC. C., NakajimaK., WeyC. L. and SaeksR., ‘Analogue fault diagnosis with failure bounds’, 24th Midwest Symposium on Circuits and Systems, Albuquerque NM USA, pp. 515–520 (29–30th June1981)
19.
GarrettC., Functional Diagnostic Strategies for Analogue Systems using Heuristic Programming Techniques, Ph.D. thesis (January1989)
20.
BuchananB. C. and ShortcliffeE. H., Rule Based Expert Systems, Addison Wesley (1984)
21.
DavisR., Reasoning from First Principles in Electronic Troubleshooting: Developments in Expert Systems, Academic Press, pp. 1–21 (1984)
22.
MilneR., ‘Functional reasoning for fault diagnosis expert systems’, Applications of Artificial Intelligence II SPIE, 548, pp. 147–152 (1985)
23.
TongD. W., JollyC. H. and ZalondekK. C., ‘Diagnostic tree design with model-based reasoning’, AUTOTESTCON 89, No. 89CH2568-4, pp. 161–167 (1989)
24.
MaikowskiL., Multiple Fault Diagnosis with Tolerance — A simulation-before-test approach, Internal document, Dept. of Elec. and Elec. Eng., University of Brighton (1992)
25.
GarrettC., ‘Reduction of internal current measurements within the failure bounds analogue diagnosis scheme’, IEE Electronics Letters, 26, No. 9, pp. 583–584 (26th April1990)
