Filter Results

Select search scope: search across all journals or within the current journal

Search this journal

Enter search terms…

Advanced search

Browse

About

About Sage
About Sage Journals
Privacy Policy
Terms of Use
Contact Us
Help

Information for

Authors
Editors
Librarians
Researchers
Reviewers
Frequently asked questions

All content on this site: Copyright © 2026 Sage Publications. All rights reserved. This website is technically supported and operated by China National Publications Import and Export (Group) Co., Ltd. 京ICP备09090397号-11

Book Review: Defect Recognition in Semiconductors before and after Processing:

International Journal of Electrical Engineering & Education

Journal indexing and metrics

Journal Homepage Submission guidelines

Restricted access

Book review

First published online April, 1994

Book Review: Defect Recognition in Semiconductors before and after Processing:

Volume 31, Issue 2

https://doi.org/10.1177/002072099403100211

Abstract

Get full access to this article

View all access options for this article.

Browse journal

Current issue OnlineFirst All issues

Similar articles

Restricted access

Cognitive Processes Supporting Recognition in Complex and Dynamic Tasks

Restricted access

RETRACTED: Multi-attribute group decision making method based on some trapezoid intuitionistic fuzzy linguistic Bonferroni mean aggregation operators

Restricted access

Special Issue of Production and Operations Management : “Global Supply Chain Risk Management”

Restricted access

SIMULTANEOUS BATCHING AND SCHEDULING FOR CHEMICAL PROCESSING WITH EARLINESS AND TARDINESS PENALTIES