Nanotechnology Instrumentation

Binnig G (1986) Phys. Rev. Lett., 56, 930.

Binnig S (1982) Surface studies by scanning tunnelling microscopy, Phys. Rev. Lett., July, 49 (No 1), 57.

Bryan J B (1979) Design and construction of an ‘Ultraprecision 84’ diamond turning machine, Precision Engineering, 1, 13.

Bugg C D King P J (1988), Scanning capacitance microscopy, J. Phys. E., Sci. Inst., 21, 147–151.

Bowen D K (1990), Meas. Sci. Tech., 1, 107.

Eigler D M Schweiger E K (1990) Positioning single atoms with a scanning tunnelling microscope, Nature, 344, April, 524.

Franks A (1987) Nanotechnology opportunities, J. Phys. E., Sci. Inst., 20, 237.

Garratt J D Bottomley S C (1990) Technology transfer in the development of a nanotopographic instrument, J. Inst. Phys. Nanotechnology, 1, 38–43.

Hansman P K (1989) The scanning conductance microscope, Science Reports, 243, 641.

Lindsey K , NPL Nanosurf 2 Prec. Eng.

Marti O (1990) Nanotechnology, 2, 141.

Muller E W (1956) Field emission microscopy in physical methods in chemical analysis, Vol. III, 135–182. New York, Academic Press.

Nakajima N (1989) Study on microengines, Sensors and Actuators, 20, 75–82.

Schonenberger C Alvarado S F (1989) A differential interferometer for force microscopy, Rev. Sci. Inst., 60 (No. 10), 3131.

Taniguchi N (1983) Current status in and future trends of ultra precision machining and ultrafine materials processing, Ann. CIRP, 32/2/, 573.

Thornton P R (1968) Scanning electron microscopy. London, Chapman and Hall.

Trimmer W S N (1980), Microrobots and micromechanical systems, Sensors and Actuators, 19, 267–287.

Whitehouse D J (1985) Instrumentation for measuring finish, defects and gloss, SPIE, 525, 106.

Whitehouse D J (1988) J. Phys. E., Sci. Inst., 21, 46.

Wickramasinghe H K (1989) Scanned probe microscopes, Scientific American, Oct., 74.

Wyko Corporation, USA.