In-Process Optical Measurement — Barton et al

Lau S K Almond D P Patel P M , Transient thermal wave techniques for the evaluation of surface coatings, J. Phys. D: Appl. Phys., 24, pp.428–436, 1991.

Kurz R Moeller R D , Continuous coating thickness measurement by the beta backscatter method, Metal Finishing, 81, pp.21–23, 1983.

Kimura S Takami K , Photoresist thickness measurement using laser-induced fluorescence, Applied Optics, 27, pp.3675–3678, 1988.

Haworth B Robinson T M , The measurement of thin PVdC coatings on PET substrates using fluorescence microscopy, Polymer Testing, 10, pp.205–219, 1991.