Abstract

References
1.
Lau
S K
Almond
D P
Patel
P M
, Transient thermal wave techniques for the evaluation of surface coatings , J. Phys. D: Appl. Phys. , 24 , pp.428 –436 , 1991 .
2.
Kurz
R
Moeller
R D
, Continuous coating thickness measurement by the beta backscatter method , Metal Finishing , 81 , pp.21 –23 , 1983 .
3.
Kimura
S
Takami
K
, Photoresist thickness measurement using laser-induced fluorescence , Applied Optics , 27 , pp.3675 –3678 , 1988 .
4.
Haworth
B
Robinson
T M
, The measurement of thin PVdC coatings on PET substrates using fluorescence microscopy , Polymer Testing , 10 , pp.205 –219 , 1991 .
