Abstract
This study is aimed at an improved understanding of the inspection of miniature computer components. It was found, for complex stimuli simulating integrated circuit chips, that subjects failed to detect over half of the targets in a 15- or 16-sec. visual-scan interval. Defects were usually detected quickly or not at all. Removing the time constraint by extending the visual scan interval to 2 min. did not substantially improve detection performance. The elimination of target uncertainty, by placing targets on all stimuli and informing subjects of this fact prior to search, had no apparent effect on inspection errors. Restricting the field of view of subjects to a series of small areas of the stimulus did not enhance the detection of the targets used in this study.
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