Two experiments were performed to determine how human performance in the assembly and inspection of microelectronic devices might be improved. The first revealed that use of tools specifically designed to minimize the probability of human error resulted in significant reductions in errors in the handling of silicon wafers. The second indicated that providing the operator with a visual frame of reference resulted in detection of a significantly greater percentage of the defects present in photo masks of the type used in production of microelectronic circuits.
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