Abstract
A method based on infrared (IR) micro-reflectance measurements for the structural characterization of glassy nanomaterials is presented. Near-specular reflectance spectra of pressed pellets can be analyzed using a model relating the structure of silicate glasses to their dielectric response and an effective medium approximation to account for the effect of porosity. The integrated intensities of phenomenological bands attributed to
This is a visual representation of the abstract.
Keywords
Get full access to this article
View all access options for this article.
