Solid Parahydrogen Thickness Revisited

Abstract

We report updated infrared (IR) absorption measurements on vapor-deposited cryogenic parahydrogen (pH₂) solids that indicate a ≈10% systematic error in our previous approach for determining a pH₂ solid's thickness (S. Tam and M.E. Fajardo. Appl. Spectrosc. 2001. 55(12): 1634-1644). We provide corrected values for the integrated absorption intensities of the Q₁(0)+S₀(0) and S₁(0)+S₀(0) bands calculated over the 4495–4520 cm⁻¹ and 4825–4855 cm⁻¹ regions, respectively. New polarized IR absorption spectroscopy data demonstrate the insensitivity to polarization effects of the peak intensity of the Q_R(0) phonon sideband near 4228 cm⁻¹. This feature provides an even quicker way for determining the thickness of a pH₂ solid than via the integrated absorptions.

Keywords

Solid parahydrogen pH2 rapid vapor deposition matrix isolation spectroscopy infrared absorption IR polarized IR absorption spectroscopy sample thickness determination

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