Efficacy and Safety of a Low-Energy Double-Pass 1450-nm Diode Laser for the Treatment of Acne Scars

Abstract

Objective: The purpose of this study was to evaluate the efficacy and safety of a 1450-nm diode laser on acne scars in Asian patients. Background data: Acne and acne scars affect individuals during puberty and adolescence, and decrease their quality of life. Methods: An open study was performed on 24 Japanese patients (17 female and 7 male, aged 15–44 years) with acne scars on the face treated with five sessions of low-energy double-pass 1450-nm diode laser at 4-week intervals. The mean duration of the acne scars prior to receiving laser therapy was 4.8 years (range 1–9). Clinical evaluation by physicians and with photographs was conducted at baseline, 1 month after the final treatment, and at a 3-month follow-up visit. Topical therapies for acne vulgaris were permitted during the follow-up period. Results: All patients completed the five treatment sessions. Seventy-five percent of the subjects showed at least 30% improvement of acne scars. At the 3-month follow-up evaluation, 92.9% of the subjects with >30% improvement maintained the effectiveness. Vesicle formation and transient hyperpigmentation also occurred in one case. Conclusions: The 1450-nm diode laser therapy was effective and well-tolerated in patients with acne scars, suggesting that this may be an appropriate modality for treating facial acne scars.