Abstract
This paper describes the treatment of chemical mechanical polishing (CMP) wastewater from a semiconductor plant through membrane-based ultrafiltration (UF) and reverse osmosis (RO) processes to improve the removal efficiency under different water recovery and to determine the possible mechanisms of membrane blocking and rejection. UF pretreatment led to 42.1–46.9% conductivity, 98.1–99.4% turbidity, and 4.5–24.5% total organic carbon (TOC) removal. These contaminants were almost completely rejected after performing subsequent RO processing: the values of the conductivity, turbidity, and TOC were reduced to 6
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