Polarized Neutron Diffraction with an Area-Sensitive Detector

Abstract

We have developed a new technique for polarized neutron diffraction utilizing a two-dimensional, area-sensitive detector. An area-sensitive detector, used in conjunction with a transmission polarizer in the scattered beam, allows us to simultaneously measure non-spin-flip (NSF) and spin-flip (SF) scattering processes and therefore increases the data collection rate by a factor of two. An experimental test was performed on a single crystal of La_5/3Sr_l/3NiO₄ which demonstrates the advantages of this method over conventional means of polarized neutron analysis.