The orientation relationships between the coating and the substrate after galvanizing (GI) and galvannealing (GA) have been studied by scanning electron microscopy (SEM) and X-ray diffraction (XRD). The δ phases in the coatings predominantly have
,
and
plane textures and showing the semi-coherent relationship with the {111} plane of the substrate. It has been found that these types of texture components are essential for the bond between the coating and the substrate. The percentage of
,
and
texture components increases initially with the increase of the holding time during the GA process before decreasing.
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,
and
plane textures and showing the semi-coherent relationship with the {111} plane of the substrate. It has been found that these types of texture components are essential for the bond between the coating and the substrate. The percentage of
,
and
texture components increases initially with the increase of the holding time during the GA process before decreasing.