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Articles (19)

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1-10 of 19 results for reflection intensity. X-ray analysis

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Select article: Instrumental Factors and Figure of Merit in the Detection of Low Concentrations by X-Ray Spectrochemical Analysis

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Research article

First published 1963-1

Instrumental Factors and Figure of Merit in the Detection of Low Concentrations by X-Ray Spectrochemical Analysis

N. Spielberg, Mechtilde Bradenstein

Applied Spectroscopy

Select article: Stirring effects on aluminium coatings electrodeposited in ionic liquids

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Research article

First published 2014-8

Stirring effects on aluminium coatings electrodeposited in ionic liquids

R. K. Choudhary, V. Kain, R. C. Hubli

Surface Engineering

Select article: Design and Characterization of X-Ray Multilayer Analyzers for the 50–1000 eV Region

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Research article

First published 1990-2

Design and Characterization of X-Ray Multilayer Analyzers for the 50–1000 eV Region

B. L. Henke, E. M. Gullikson, J. Kerner [...]

Journal of X-Ray Science and Technology

Select article: Crystallite Orientation in Natural Cellulose Fibers

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Research article

First published 1969-11

Crystallite Orientation in Natural Cellulose Fibers

T. Radhakrishnan, N. B. Patil, N. E. Dweltz

Textile Research Journal

Select article: The Importance of Experimental Conditions on the Structural State of Keratin Fibers at Different Extensions as Indicated by X-ray Diffraction Patterns

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Other

First published 1970-09

The Importance of Experimental Conditions on the Structural State of Keratin Fibers at Different Extensions as Indicated by X-ray Diffraction Patterns

B.M. Chapman

Textile Research Journal

Select article: Quantitative Analysis of Powdery Sample by Diffuse Reflectance Infrared Fourier Transform Spectrometry: Determination of the α -Component in Silicon Nitride

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Research article

First published 1991-9

Quantitative Analysis of Powdery Sample by Diffuse Reflectance Infrared Fourier Transform Spectrometry: Determination of the α -Component in Silicon Nitride

Akira Tsuge, Yoshinori Uwamino, Toshio Ishizuka [...]

Applied Spectroscopy

Select article: A Scanning Soft X-Ray Microscope with an Ellipsoidal Focusing Mirror

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Research article

First published 1992-5

A Scanning Soft X-Ray Microscope with an Ellipsoidal Focusing Mirror

J. Voss, H. Dadras, C. Kunz [...]

Journal of X-Ray Science and Technology

Select article: A Pragmatic Smoothing Method for Improving the Quality of the Results in Atomic Spectroscopy

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Research article

First published 2017-7

A Pragmatic Smoothing Method for Improving the Quality of the Results in Atomic Spectroscopy

Leonardo Bennun

Applied Spectroscopy

Select article: Spectral Sharpening Algorithm for a Polychromatic Reflectometer in the Extreme Ultraviolet

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Research article

First published 2010-4

Spectral Sharpening Algorithm for a Polychromatic Reflectometer in the Extreme Ultraviolet

M. Banyay, L. Juschkin

Applied Spectroscopy

Select article: Predictive evaluation of powder X-ray diffractograms of pharmaceutical formulation powders based on infrared spectroscopy

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Research article

First published 2020-9

Predictive evaluation of powder X-ray diffractograms of pharmaceutical formulation powders based on infrared spectroscopy

Yuta Otsuka, Akira Ito, Masaki Takeuchi [...]

Bio-Medical Materials and Engineering

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