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nanoelectronics packaging
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Select article: Simulating Damage Mechanics of Electromigration and Thermomigration
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Research article
First published August, 2008
Simulating Damage Mechanics of Electromigration and Thermomigration
Shidong Li,
Mohd F. Abdulhamid,
Cemal Basaran
SIMULATION
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Select article: Anisotropic constitutive model coupled with damage for Sn-rich solder: Application to SnAgCuSb solder under tensile conditions
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Research article
First published 2021
Anisotropic constitutive model coupled with damage for Sn-rich solder: Application to SnAgCuSb solder under tensile conditions
Zhao Zhang,
Sheng Liu
,
Kun Ma
[...]
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International Journal of Damage Mechanics
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