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inrush traction-return current
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Select article: A solution to transient failures of HVI track circuits caused by inrush interference based on wavelet analysis
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Research article
First published March, 2017
A solution to transient failures of HVI track circuits caused by inrush interference based on wavelet analysis
Zanwu Huang,
Clive Roberts,
Lei Chen
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Proceedings of the Institution of Mechanical Engineers,Part F: Journal of Rail and Rapid Transit
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