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Research article

First published 2009-9

Tracing the Acetalization of Cyclohexanone in CO 2 -Expanded Alcohols by Attenuated Total Reflection Infrared Spectroscopy

Tsunetake Seki, Jean-Michel Andanson, Fabian Jutz [...]

Applied Spectroscopy

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Research article

First published 1995-9

Comparative Surface Adsorption Behavior of High- and Low-Density Lipoproteins as Analyzed by FT-IR/ATR Spectroscopy

Yuhong Hu, Bal Ram Singh

Applied Spectroscopy

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Other

First published 2007-02

Fourier Transform Infrared Analysis of Cotton Contamination

Noureddine Abidi, Eric Hequet

Textile Research Journal

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Research article

First published 2003-11

Infrared Method for In Situ Studies of Polymer/Surfactant Adsorption on Silica Powders from Aqueous Solution

Cuihong Jiang, Haiyan Li, Carl P. Tripp

Applied Spectroscopy

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Research article

First published 2006-6

Differentiation of Selected Salmonella Enterica Serovars by Fourier Transform Mid-Infrared Spectroscopy

Nathan A. Baldauf, Luis A. Rodriguez-Romo, Ahmed E. Yousef [...]

Applied Spectroscopy

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Research article

First published 2004-12

Validation of Macroscopic Attenuated Total Reflection-Fourier Transform Infrared Imaging to Study Dissolution of Swelling Pharmaceutical Tablets

Jaap Van Der Weerd, Sergei G. Kazarian

Applied Spectroscopy

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Research article

First published 2000-11

Light-Induced Two-Dimensional FT-IR Spectroscopy of BacterioRhodopsin

P. G. H. Kosters, A. H. B. de Vries, R. P. H. Kooyman

Applied Spectroscopy

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Research article

First published 1999-9

Generalized Two-Dimensional Fourier Transform Infrared Multiple-Angle Attenuated Total Reflection Spectral Depth-Profiling Analysis of Multilayer Samples

Yuji Nishikawa

Applied Spectroscopy

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Research article

First published 1992-7

A New Spectroscopic Technique for in situ Chemical Reaction Monitoring Using Mid-Range Infrared Optical Fibers

William R. Moser, Joseph R. Berard, Peter J. Melling [...]

Applied Spectroscopy

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Research article

First published 1995-8

FT-IR/ATR Analysis of the Silicon/Aqueous Solution Interface Using Sputtered Silicon Thin Films to Access the 1550–1100 cm −1 Spectral Region

Roger P. Sperline, Joong S. Jeon, Srini Raghavan

Applied Spectroscopy

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