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Select article: Characterization of V-defects in InGaN Single Quantum Well Films at the Nanometer Level by High-Spatial-Resolution Cathodoluminescence Spectroscopy

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Research article

First published January, 2008

Characterization of V-defects in InGaN Single Quantum Well Films at the Nanometer Level by High-Spatial-Resolution Cathodoluminescence Spectroscopy

M. Yoshikawa, M. Murakami, H. Ishida [...]

Applied Spectroscopy

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