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Select article: Accuracy of X-ray computed tomography for dimensional metrology with employment of a new threshold selection method

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Research article

First published September 20, 2018

Accuracy of X-ray computed tomography for dimensional metrology with employment of a new threshold selection method

Tomasz Kowaluk, Adam Wożniak

Journal of X-Ray Science and Technology

Select article: A simulation-based study on the influence of beam hardening in X-ray computed tomography for dimensional metrology

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Research article

First published January, 2015

A simulation-based study on the influence of beam hardening in X-ray computed tomography for dimensional metrology

Joseph J. Lifton, Andrew A. Malcolm, John W. McBride

Journal of X-Ray Science and Technology

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