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1-2 of 2 results for Etch end point detection

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Select article: Evaluation of Silicon-Chemiluminescence Monitoring as a Novel Method for Atomic Fluorine Determination and End Point Detection in Plasma Etch Systems

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Research article

First published July, 1981

Evaluation of Silicon-Chemiluminescence Monitoring as a Novel Method for Atomic Fluorine Determination and End Point Detection in Plasma Etch Systems

P. A. Zijlstra, C. I. M. Beenakker

Applied Spectroscopy

Select article: Banding versus Bonding of First Permanent Molars: A Multi-centre Randomized Controlled Trial

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First published June, 2011

Banding versus Bonding of First Permanent Molars: A Multi-centre Randomized Controlled Trial

Mariyah Nazir, Tanya Walsh, Nicky A Mandall [...]

Journal of Orthodontics

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