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1-4 of 4 results for EUV lithography

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Select article: Organisational Investment: The Case of ASML—Can the Product Make the Producer?

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Research article

First published 2023-2

Organisational Investment: The Case of ASML—Can the Product Make the Producer?

An-Chi Tung, Henry Wan

Foreign Trade Review

Select article: Non-astigmatic imaging with matched pairs of spherically bent crystals or reflectors

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Research article

First published 2009-5

Non-astigmatic imaging with matched pairs of spherically bent crystals or reflectors

M. Bitter, K.W. Hill, F. Jones [...]

Journal of X-Ray Science and Technology

Select article: Some parameter considerations for radiation sources at 11.5 and 13.5 nm

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Research article

First published 2001-2

Some parameter considerations for radiation sources at 11.5 and 13.5 nm

H.-J. Kunze, L. Juschkin, S. Ellwi

Journal of X-Ray Science and Technology

Select article: Design of a Normal Incidence Multilayer Imaging X-Ray Microscope

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Research article

First published 1989-11

Design of a Normal Incidence Multilayer Imaging X-Ray Microscope

David L. Shealy, David R. Gabardi, Richard B. Hoover [...]

Journal of X-Ray Science and Technology

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